Gijs Smit

Gijs Smit received his joint Bachelor's degree in Data Science from Eindhoven University of Technology and Tilburg University in 2019. He obtained his Master's degree in Data Science in Engineering at Eindhoven University of Technology. From August 2020 to February 2021, he performed his Master's internship at the Computational Pathology group. He worked on the use of deep learning to detect artifacts in whole slide images under the supervision of Caner Mercan and Francesco Ciompi.

Finished research projects: